eng pur mfg plan sm cc qa emc technology cage code # 24602 dwg # 1010025000 8851 sw old kansas ave. change notice en 03-291 rev lvl - stuart, fl 34997 sheet 1 of 3 title: specification control drawing part identifier: hr95xxxt3 (x)=test code: a=group a; b=group b; c=group c (xx)=db value (01-20db) description: chip attenuator with high reliability testing. note: single lot and date code available upon request. assembly dwg: n/a 1.0 specifications: 1.1 electrical: 1.1.1 impedance: 50 ohms nominal. 1.1.2 frequency range: dc-18 ghz. 1.1.3 attenuation values available: 0-20 db in 1 db increments. 1.1.4 attenuation accuracy: see table. attenuation accuracy db dc - 4 ghz 4 - 8 ghz 8 - 12.4 ghz 12.4 - 18 ghz 0 -0,+.3 -0,+.5 -0,+.5 -0,+.5 1 -3 0.3 0.5 0.5 0.5 4 - 6 0.4 0.5 0.5 0.75 7 - 10 0.5 0.5 0.75 1.0 11 - 15 0.75 + 0.5,-3.0 + 0.5,-3.5 --- 16 - 20 1.0 + 0.5,-4.0 + 1.0,-6.0 --- 1.1.5 vswr: dc - 4 ghz - 1.25 8 - 12.4 ghz - 1.50 4 - 8 ghz - 1.35 12.4 - 18 ghz - 1.50 1.1.6 input power (max @ 25c): 1.1.6.1 average: 100mw watts. 1.1.6.2 peak: 1 watt for 10us pulse width @ 1% duty cycle. 1.2 mechanical: 1.2.1 outline dwg: see sheet 3. 1.2.2 workmanship: per mil-r-55342. 1.3 environmental: 1.3.1 altitude: 1.3.1.1 non-operating: sea level to 50,000 feet. 1.3.1.2 operating: sea level to 50,000 feet. 1.3.2 temperature range: 1.3.2.1 non-operating: -55 c to +150 c. 1.3.2.2 operating: -55c to +150c. 1.3.3 vibration: per mil-std-202, method 204, cond. d. 1.3.4 shock: per mil-std-202, method 213, cond. i. 1.3.5 moisture resistance: per mil-std-202, method 106 except subcycle steps 7a and 7b and polarization and load are not applicable. 2.0 unit marking: marked only with color dot. legibility and permanency per mil-std-130. 3.0 quality assurance: 3.1 verify 100% visual pre-cap in spection performed per tp-8965. 3.2 perfom group a, b and/or c testing as indicated by the part number per tp-8965. 3.2.1 group a testing 3.2.1.1 visual and mechnical inspection per sheet 3. 3.2.1.2 initial rf measurements ? measure and record vswr @ 1 ghz and attenuation at dc (0 ghz) and 1.0 ghz. 3.2.1.3 thermal shock ? 10 cycles from -55c to +125c.
emc technology cage code # 24602 dwg # 1010025000 8851 sw old kansas ave. change notice en 03-291 rev lvl - stuart, fl 34997 sheet 2 of 3 3.2.1.4 after thermal shock rf measureme nts - measure and record vswr @ 1 ghz and attenuation at dc (0 ghz) and 1.0 ghz. 3.2.1.5 burn-in ? duration of 168 hrs at input power per 1.1.6. 3.2.2 group b testing (7 samples approved from group a). 3.2.2.1 sub-group 1 (3 samples) 3.2.2.1.1 low temperature operation 3.2.2.1.1.1 use final electrical measurements from group a 3.2.2.1.1.2 dissipate low power for a duration of 45 +5/-0 minutes. allow to stabilize at 25c for 24 hours. 3.2.2.1.2 after low temperature electr ical measurements - measure and record vswr @ 1 ghz and attenuation at dc (0 ghz) and 1.0 ghz. 3.2.2.1.3 high temperature bake ? +125c +/- 5c for 100 hrs then stabilize at 25c for 4 hrs. 3.2.2.1.3.1 visual examination. inspect for evidence of mechancial damage. 3.2.2.1.4 after high temperature bake electrical test - measure and record vswr @ 1 ghz and attenuation at dc (0 ghz) and 1.0 ghz. 3.2.2.1.5 termination adhesion - solder a wire and pull with 15 grams perpendicular to and away from the surface area. 3.2.2.1.5.1 visual inspection ? there shall be no separation of material. 3.2.2.1.6 termination solderability immerse each sample 5 seconds in a solder pot held at 220c +/- 5c using 60/40 or 63/37 tin-lead composition. 3.2.2.2 sub-group 2 (4 samples) 3.2.2.2.1 initial rf measurements - use final electrical measurements from group a. 3.2.2.2.2 life test ? operate samples uni ts for 1000 hrs at 70c at input power per 1.1.6 . electrical measurements shall be made at 250 +48/-0 hrs, 500 +48/-0 hrs, and 1000 +48/-0 hrs. 3.2.2.2.3 final rf measurements - measure and record vswr @ 1 ghz and attenuation at dc (0 ghz) and 1.0 ghz. 3.2.3 group c (qci testing 4 samples approved from group a). 3.2.3.1 load life test ? burn-in units at 70c with input power per 1.1.6 for a duration of 1000 hours (1 ? hours on, ? hour off). measure and record electricals at 0, 250, 500, and 1000 hours. 3.2.3.2 after load life rf measurements ? measure and record vswr and attenuation at 1 ghz at 25c. test acceptable limits per 4.2.1 of tp-8965. 3.4 test data requirements: 3.4.1 test data required for cus tomer - see paragraph 5.0 of tp-8965. 3.4.2 data retention - 24 months. 3.4.3 test samples required for customer - see paragraph 5.0 of tp-8965. 4.0 packaging: standard pack per mc0023. (serialized waffle pack)
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